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Figure 3
System diagram: (1) He–Ne laser (λ = 0.6328 µm); (2) polarizer; (3) diffuser; (4) plane-parallel crystal plate with positive optical sign, cut perpendicular to the optical axis; (5) investigated crystal plate installed at angle α = 5–15° between the optical axis and the axis of the optical system; (6) analyser; (7) screen.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 43| Part 5| October 2010| Pages 955-958
https://doi.org/10.1107/S0021889810022375
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