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Figure 4
(a) Reconstructed complex wavefront of the probe in the sample plane, with brightness and hue illustrating magnitude and phases, respectively. (b) Line plot of beam intensity integrated along the x direction at z = 0 mm and z = 4.04 mm. (c) Beam intensity integrated along the x direction of the propagated probe. The vertical focus is located 4.04 mm downstream of the sample plane.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 45| Part 4| June 2012| Pages 778-784
doi:10.1107/S0021889812018900
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