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Figure 1
Horizontal and vertical beam profiles at the sample (samx, samz) and the beamstop (bsx, bsz) positions, as obtained by knife-edge scans. Solid lines show the measured profiles and dashed lines the corresponding Gaussian fits.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 46| Part 1| January 2013| Page 286
doi:10.1107/S0021889812050054
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