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Figure 2
Revised instrumental resolution Δqres for the GISAXS-I geometry (solid line) using the vertical beam divergence as determined by knife-edge scans. Also shown are the partial contributions due to geometric (dashed line), band width (dotted line) and divergence smearing (dash–dotted line).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 46| Part 1| January 2013| Page 286
doi:10.1107/S0021889812050054
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