view article
Figure 8
Stacking sequences of tetrahedron layers for the four most commonly occurring SiC polytypes: (a) T1T2T3, (b) T1T2T1′T3′, (c) T1T3′T2′T1′T2T3 and (d) T1T2T1′T3′T2′T3T1T3′T2′T1′T2T3T2′T1′T3′. Unit cells not drawn to scale.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 46| Part 1| January 2013| Pages 242-247
doi:10.1107/S0021889812049151
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS