view article
Figure 4
XPS spectra of the sample at X = 18 mm before (lower spectrum, thin black line) and after (upper spectrum, thick line) the Ar sputter cleaning: (a) O1s and V2p, (b) C1s, (c) Al2s, and (d) N1s. For better comparison, the spectra are vertically shifted.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 46| Part 4| July 2013| Pages 1064-1075
doi:10.1107/S0021889813014477
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS