High-quality quartz single crystals for high-energy-resolution inelastic X-ray scattering analyzers

Hönnicke, M.G.; Huang, X.; Cusatis, C.; Koditwuakku, C.N.; Cai, Y.Q.

doi:10.1107/S0021889813004731

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 1
Theoretical symmetric back-diffraction profiles for α-SiO₂ (quartz) showing high reflectivities even at lower energies. (a) α-SiO₂ $[\overline 2110]$ (X-cut) at 2.5 keV, (b) α-SiO₂ $[\overline 4220]$ (X-cut) at 5.05 keV, (c) α-SiO₂ $[\overline 6330]$ (X-cut) at 7.57 keV, (d) α-SiO₂ $[\overline 8440]$ (X-cut) at 10.09 keV, (e) α-SiO₂ $[{\overline {10}}\,5\,5\,0]$ (X-cut) at 12.6 keV and (f) α-SiO₂ $[\overline 743\overline 4]$ at 9.978 keV.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 46| Part 4| June 2013| Pages 939-944

doi:10.1107/S0021889813004731

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