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Figure 7
Proposed multi-energy inelastic X-ray scattering spectrometer based on different diffraction orders of the α-SiO2 X-cut monochromator and spherical analyzer. The multi-bounce α-SiO2 X-cut monochromator is set, in an oven, downstream of an Si 111 cryo-cooling pre-monochromator. The energy scan, based on the inverse geometry, is taken by changing the temperature of the α-SiO2 X-cut monochromator. A spherical analyzer, or a set of them, and a position-sensitive detector complete the setup.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 46| Part 4| June 2013| Pages 939-944
doi:10.1107/S0021889813004731
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