view article

Figure 7
(a) Ripple formations obtained at the Si surface corrugated with ion beam sputtering and observed by AFM (Dimension Edge, Bruker AXS) in the tapping mode (cantilever OTESPA, Bruker AXS). (b) Corresponding GISAXS map with truncation rods.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds