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Figure 7
(a) Ripple formations obtained at the Si surface corrugated with ion beam sputtering and observed by AFM (Dimension Edge, Bruker AXS) in the tapping mode (cantilever OTESPA, Bruker AXS). (b) Corresponding GISAXS map with truncation rods.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 46| Part 4| June 2013| Pages 945-952
doi:10.1107/S0021889813006122
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