view article

Figure 1
AFM images of (a) CaF2(111), (b) CaF2(001) and (c) CaF2(110) layers on Si.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds