view article

Figure 2
(a) Intensity of in-plane Si 400 diffraction versus angle of incidence αi for a sample with Si islands only and (b) its dependence on in-plane orientation φ for Si substrate and islands.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Follow J. Appl. Cryst.
Sign up for e-alerts
Follow J. Appl. Cryst. on Twitter
Follow us on facebook
Sign up for RSS feeds