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![[Figure 2]](xz5001fig2mag.jpg)
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Figure 2
(a) Intensity of in-plane Si 400 diffraction versus angle of incidence αi for a sample with Si islands only and (b) its dependence on in-plane orientation φ for Si substrate and islands. |
![[Figure 2]](xz5001fig2.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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Figure 2
(a) Intensity of in-plane Si 400 diffraction versus angle of incidence αi for a sample with Si islands only and (b) its dependence on in-plane orientation φ for Si substrate and islands. |
| JOURNAL OF APPLIED CRYSTALLOGRAPHY |
