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Figure 3
(a) In-plane 400 diffraction curve at αi = 0.18° and its fitting by four Gaussian profiles and (b) the estimated in-plane lattice parameters for similar fittings at different αi values. The data shown with black filled symbols were obtained by synchrotron measurements of 400 and 620 diffraction for comparison.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 46| Part 4| June 2013| Pages 868-873
doi:10.1107/S0021889813003518
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