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Figure 7
In-plane 400 diffraction curve at αi = 0.16° of a sample with an Si0.7Ge0.3 buffer layer and its fitting by five Gaussian profiles (a); estimated in-plane lattice parameters for similar fittings at different αi values (b).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 46| Part 4| June 2013| Pages 868-873
doi:10.1107/S0021889813003518
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