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Figure 9
Plane view TEM micrograph of a sample with an Si0.7Ge0.3 buffer layer showing the Ge/SiGe/Si nano-islands only.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 46| Part 4| June 2013| Pages 868-873
doi:10.1107/S0021889813003518
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