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Figure 1
Measured rocking curves for the Si0.4Ge0.6 epilayers on Si substrates with thicknesses of 2–6 nm around the 004 Bragg reflection.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 46| Part 4| June 2013| Pages 898-902
doi:10.1107/S0021889813010492
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