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Figure 3
Measured rocking curves around the 004 Bragg reflection for Si0.4Ge0.6/Si samples of thickness 50, 100 and 200 nm.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 46| Part 4| June 2013| Pages 898-902
doi:10.1107/S0021889813010492
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