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Figure 1
Schematic layout of the experiment. A white beam from an undulator source (U) is monochromated by a double-crystal monochromator and shaped using a pair of slits (SL1, SL2). The sample (S) is located at 87.7 m distance from the source. Diffraction patterns are recorded by a two-dimensional detector (D) positioned at 5.2 m distance behind the sample.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 46| Part 4| June 2013| Pages 903-907
doi:10.1107/S0021889813003725
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