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Figure 1
SEM images of (a) undoped sample (A) of series 1, (b) sample (B) with doping level 1 × 1017 cm−3 from series 1, (c) sample (C) with doping level 1 × 1018 cm−3 from series 1 and (d) sample (D) from series 2 with doping level 1 × 1017 cm−3. (e) Large area image of sample (B); places of damaged oxide surface are marked with red lines.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 46| Part 4| June 2013| Pages 893-897
doi:10.1107/S0021889813010522
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