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Figure 1
X-ray elastic strains were characterized using the [\sin^{{2}}\psi] method by measuring lattice spacing d(hkl) at different sample tilt angles ψ along the direction of the diffraction vector [{ {\bf Q}}]. The angle ψ represents the angle between the sample normal [{{\bf n}}] and [{{\bf Q}}]. By varying the angle ψ, the X-ray penetration depth τ was tuned (Hauk, 1997BB13; Birkholz, 2006BB2).

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