view article
Figure 1
X-ray elastic strains were characterized using the [\sin^{{2}}\psi] method by measuring lattice spacing d(hkl) at different sample tilt angles ψ along the direction of the diffraction vector [{ {\bf Q}}]. The angle ψ represents the angle between the sample normal [{{\bf n}}] and [{{\bf Q}}]. By varying the angle ψ, the X-ray penetration depth τ was tuned (Hauk, 1997BB13; Birkholz, 2006BB2).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 46| Part 5| October 2013| Pages 1378-1385
https://doi.org/10.1107/S0021889813019535
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS