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Figure 11
Residual stress gradients in the blasted coating evaluated using the X-ray nanodiffraction approach [\sigma _{{22}}(z)] and Laplace method [\sigma _{{{\rm L}}}(z)]. [\sigma _{{{\rm FEM}}}(z)] represents the recalculated stress profile using the FEM model. The stresses [\sigma _{{22}}(z)] in the as-deposited coating show a small variation across the thickness. The filled bands behind the [\sigma _{{22}}(z)] experimental dependencies document the measurement errors. The relatively small tensile stress increase in both samples at the depth of about 5.5 µm was caused by the temperature increase during the deposition.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 46| Part 5| October 2013| Pages 1378-1385
https://doi.org/10.1107/S0021889813019535
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