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Figure 2
(a) A photograph of the sample fixed to the holder. (b) Sample and X-ray beam geometries. L is the distance from the fixed end to the free end, l the distance from the free end to the incident plane of the X-rays and D the displacement of the crystal end from the flat surface. (c) A schematic diagram of the measuring system. xL is the distance between the incident point of the X-rays and the crystal edge in the incident plane.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 46| Part 5| October 2013| Pages 1261-1265
https://doi.org/10.1107/S0021889813019067
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