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Figure 5
(a) A photograph of the cantilever for applying force in the opposite direction to gravity. (b) The geometry of the sample and X-rays. (c) A schematic diagram of the measuring system after the Si(111) double-crystal monochromator in Fig. 2[link](c). An Si(220) perfect crystal is inserted between the double-crystal monochromator and Slit 1 in Fig. 2[link](c). Slit 1 is rotated 34° anticlockwise and Slit 2 34° clockwise from the positions in Fig. 2[link](c). The vertical widths of Slit 1 and Slit 2 are both 40 µm.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 46| Part 5| October 2013| Pages 1261-1265
https://doi.org/10.1107/S0021889813019067
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