Three-dimensional rotation electron diffraction: software RED for automated data collection and data processing

Wan, W.; Sun, J.; Su, J.; Hovmöller, S.; Zou, X.

doi:10.1107/S0021889813027714

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 11
(a) The three-dimensional reciprocal lattice of calcined silicalite-1 reconstructed from the RED data and (b)–(d) two-dimensional slices cut from the reconstructed three-dimensional reciprocal lattice showing the (b) 0kl, (c) h0l and (c) hk0 planes.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 46| Part 6| December 2013| Pages 1863-1873

https://doi.org/10.1107/S0021889813027714

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