Three-dimensional rotation electron diffraction: software RED for automated data collection and data processing

Wan, W.; Sun, J.; Su, J.; Hovmöller, S.; Zou, X.

doi:10.1107/S0021889813027714

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 8
Back projection of a diffraction spot R in a diffraction pattern onto the Ewald sphere at R′. O is the centre of the diffraction pattern and O′ the centre of the Ewald sphere.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 46| Part 6| December 2013| Pages 1863-1873

https://doi.org/10.1107/S0021889813027714

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