view article
Figure 8
The influence of sample position errors with respect to the 2θ axis. The x and y displacements of the sample with respect to the 2θ axis are normal and parallel to the incident beam, and are a function of the scattering angle.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 46| Part 6| December 2013| Pages 1626-1639
https://doi.org/10.1107/S0021889813027313
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS