Comparison between a near-field and a far-field indexing approach for characterization of a polycrystalline sample volume containing more than 1500 grains

Nervo, L.; King, A.; Wright, J.P.; Ludwig, W.; Reischig, P.; Quinta da Fonseca, J.; Preuss, M.

doi:10.1107/S160057671401406X

Journal of Applied Crystallography Journal of Applied
Crystallography

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Figure 1
The experimental setup, with high-resolution near-field and low-resolution far-field detectors and a vertical rotation axis configuration, at beamline ID11 of the ESRF (Grenoble, France).

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 47| Part 4| August 2014| Pages 1402-1416

https://doi.org/10.1107/S160057671401406X

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