view article
Figure 14
Normalized experimental rocking curves (on a logarithmic scale) of the Si 444 reflections at 23.879 keV. Curve 1 (black) is measured as lapped; curve 2 (red) is measured after optical polishing (1 µm diamond grain); curves 3–5 (green, dark blue and light blue) are measured after 10, 20 and 30 min respectively; curve 6 (purple) is measured after one MCP step between the optical polishing and the chemical etching(s).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 47| Part 4| August 2014| Pages 1304-1314
https://doi.org/10.1107/S1600576714012527
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS