Transmission electron microscopy analysis of the crystallography of precipitates in Mg–Sn alloys aged at high temperatures

Nie, X.; Guan, Y.; Zhao, D.; Liu, Y.; Gui, J.; Li, L.; Wang, J.

doi:10.1107/S160057671401958X

Figure 4
(a) TEM bright-field image of the as-cast Mg–9.76 wt% Sn alloy after annealing at 823 K for 12 h and before aging. (b) Corresponding SAED pattern obtained from the internal region of an α-Mg grain in (a). (c) TEM bright-field image of the Mg–9.76 wt% Sn alloy aged at 573 K for 5 h to peak hardness. The inset shows a high-magnification image of the particle marked as P₁. (d) SAED pattern of particle P₁ and the matrix [in (c)] along the $[{[001]_\beta }//{[2\overline 1\overline 10]_\alpha }]$ direction. (e) Corresponding simulated electron diffraction pattern of (d). Open circles represent β-Mg₂Sn and filled circles represent α-Mg. (f) SAED pattern of P₁ and the matrix [in (c)] along the $[{[1\overline 10]_\beta }//{[01\overline 10]_\alpha }]$ direction. (g) Corresponding simulated electron diffraction pattern of (f). Open circles represent β-Mg₂Sn and filled circles represent α-Mg. (h) SAED pattern of particle Q₁ and the matrix [in (c)] along the $[{[\overline 111]_\beta }//{[1\overline 210]_\alpha }]$ direction. (i) Corresponding simulated electron diffraction pattern of (h). Open circles represents β-Mg₂Sn and filled circles represent α-Mg. (j) TEM bright-field image of the Mg–9.76 wt% Sn alloy aged at 573 K for 5 h, corresponding to its peak hardness, along the $[{[0001]_\alpha }]$ direction. (k) SAED pattern of the matrix [in (j)] along the $[{[0001]_\alpha }]$ direction.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 47| Part 5| September 2014| Pages 1729-1735

doi:10.1107/S160057671401958X

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