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Figure 1
Schematics of the experimental geometry. (a) The illumination profile of a focused KB beam illuminating several SAW wavelengths (yellow region) on the substrate. (b) The coherent far-field diffraction pattern is collected at a distance of 5.2 m behind the sample. (c) In the experiment, the SAW device was placed vertically into the beam. Interdigital transducers (labeled IDT) define the SAW wavelength and frequency. After proper synchronization, the signal applied to the IDTs was varied in phase, amplitude and frequency.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 47| Part 5| September 2014| Pages 1596-1605
doi:10.1107/S1600576714016896
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