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Figure 8
Experimental (left) and simulated (right) diffraction intensities as measured and simulated for a SAW with wavelength [\lambda _{{\rm SAW}}=48.8] µm and amplitude A = 1 nm, using the experimental parameters of detector distance 5.2 m and pixel size 172 µm. The incident angle is varied from 0.15 to 0.35° in 0.05° steps (left to right). qx isolines with spacing [\Delta q_{x}=1.3\times 10^{{-4}}] nm−1 (corresponding to a real-space interval [\lambda _{{\rm SAW}}]) are superimposed for comparison. All satellite peaks of the simulated data are very well matched in position to the experimental satellite peaks. A Gaussian illumination profile was used in the simulation, resulting in a Gaussian lineshape of the satellites (simulated far-field pattern).

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 47| Part 5| September 2014| Pages 1596-1605
doi:10.1107/S1600576714016896
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