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Figure 5
(a) Five representative GISAXS patterns from thin (left) to thick (right) Au layers. The gray dashed line indicates the qy position of the Yoneda peak of silicon. (b) Map of extracted horizontal line cuts at the Yoneda peak position of silicon as a function of the frame number. The inset shows an individual fit of frame 2000, indicated by the white (data) and red (fit) dashed lines. (c) Map of the corresponding fitted horizontal line cuts. The logarithmic intensity scale bar applies to all figures.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 47| Part 5| September 2014| Pages 1797-1803
doi:10.1107/S1600576714019773
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