Reconstruction of crystal shapes by X-ray nanodiffraction from three-dimensional superlattices

Meduňa, M.; Falub, C.V.; Isa, F.; Chrastina, D.; Kreiliger, T.; Isella, G.; Känel, H. von

doi:10.1107/S1600576714023772

Figure 4
Probing the SL crystal structure with a nanofocused synchrotron radiation beam. Slices through the three-dimensional RSM of width ΔQ = 0.001 Å⁻¹ for (a) Q_y = 0.006 Å⁻¹ and (b) Q_x = 1.572 Å⁻¹, and (c) projection onto the Q_xQ_y plane integrated along Q_z, recorded at the top center of the Ge crystal. The inset SEM micrograph shows schematically the position of the X-ray beam with respect to the cross section/projection plane. The schematics in (d), (e) and (f) show the distribution of SL peaks along significant crystallographic directions corresponding to the top crystal facets, i.e. (113), $[(1\overline 13)]$ , $[(\overline 113)]$ and $[(\overline {11} 3)]$ . The solid lines correspond to the peak shapes and truncation rods observed in the corresponding cross section through the three-dimensional RSM, and the dashed lines indicate these as they would be observed out of the realized cross section, e.g. when projected onto the corresponding plane. In the case of a nanofocused synchrotron beam, the SL peaks are observed as oblique narrow discs owing to the large divergence of the X-ray beam induced by the Fresnel focusing system (see Falub et al., 2013

). In panels (e) and (f) the yellow area demonstrates the Q_xQ_z slice where the intensity is integrated over Q_y. I – focused synchrotron beam, as plotted in panel (a). II – beam collimated by Soller optics, as plotted in Fig. 3

(b). III – beam with high divergence in Q_y, as from a laboratory X-ray tube.

JOURNAL OF
APPLIED
CRYSTALLOGRAPHY

ISSN: 1600-5767

Volume 47| Part 6| November 2014| Pages 2030-2037

doi:10.1107/S1600576714023772

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