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![[Figure 1]](aj5246fig1mag.jpg)
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Figure 1
(a) Sample holder mask schematic. The horizontal lines are 30 µm thick and the slanted crossbars are 56 µm thick (measured perpendicular to the edge). (b) Cartoon of a sample holder in two different orientations. The first orientation is a top down view. The second has been rotated 30°. The X-ray path length is 1.0 mm, the X-ray window thickness is ∼27 µm and the X-ray windows are ∼620 µm tall. (c) Optical image of an empty sample holder, top down view. Composited from four images to achieve focus for the entire holder. The scale is the same as in (a). (d) Cartoon view of the holder rotated 80° from the top down view. The walls have been made semi-transparent so that the X-ray accessible volume is visible. The X-ray beam is shown in black. |
![[Figure 1]](aj5246fig1.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
