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Figure 1
(a) Scanning electron micrograph of a self-suspended Au nanowire crossing an Si microtrench. (b) Schematic representation of the crystallographic directions with respect to the experimental configuration. (c) Reciprocal space map of the Au111 Bragg reflection and (d) the corresponding Patterson function for the Au nanowire presented in (a). (e) In situ AFM topography and (f) Au LIII fluorescence map of the Au nanowire recorded simultaneously.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48| Part 1| February 2015| Pages 291-296
https://doi.org/10.1107/S1600576715001107
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