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Figure 2
(a) Sequence of in situ µLaue diffraction patterns displaying the evolution of the Au111 and the Si001 Laue spots during the three-point bending of the Au nanowire. (b) Bending angle inferred from the in situ µLaue diffraction patterns as a function of the movement of the piezo stage carrying the AFM cantilever.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48| Part 1| February 2015| Pages 291-296
https://doi.org/10.1107/S1600576715001107
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