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Figure 3
(a) Experimental and FEM simulated bending angle (with and without taking into account geometric nonlinearities) of the Au nanowire at 1.8 µm distance from the loading point as a function of the piezo movement corresponding to the applied load. The inset illustrates, to scale, the position and the size of both the AFM tip and the X-ray beam during the experiment. FEM simulations of (b) the total displacement, (c) the stress [\sigma_{yy}] along the wire and (d) the volumetric strain for the Au nanowire calculated for a point load of 360 nN using COMSOL Multiphysics.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48| Part 1| February 2015| Pages 291-296
https://doi.org/10.1107/S1600576715001107
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