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Figure 8
(a) A typical electron diffraction pattern of the SnO2 nanoparticle specimen. Panels (b) and (c) show the TEM image of the SnO2 sample at low and high magnification, respectively.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48| Part 1| February 2015| Pages 244-251
https://doi.org/10.1107/S1600576715000412
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