addenda and errata
An X-ray diffractometer using mirage diffraction. Erratum
aSaitama Institute of Technology, Fukaya, Saitama 369-0293, Japan, bInstitute of Material Structure Science, KEK-PF, High Energy Accelerator Research Organization, Tsukuba, Ibaraki 305-0801, Japan, and cUniversity of Yamanashi, Kofu 400-8510, Japan
*Correspondence e-mail: email@example.com
Errors in the article by Fukamachi, Jongsukswat, Ju, Negishi, Hirano & Kawamura [J. Appl. Cryst. (2014), 47, 1267–1272] are corrected.
Keywords: mirage diffraction; mirage fringes; interference fringes; X-ray difractometers; monochromators; dynamical theory of X-ray diffraction.
In the article by Fukamachi et al. (2014), there are errors in Fig. 2 (§2, p. 1268) and in equations (12)–(16) (§4, p. 1270–1271).
The equations should read
Then, rather than the value of 11 meV for |δE| in the first line of the left column on p. 1271, the value should read 10 meV. Rather than −3.0, −5.0, −6.7 and −7.9 meV for the values of in Table 1, they should read −2.7, −4.6, −6.2 and −7.3 meV, respectively. In spite of these corrections, the conclusions are not affected.
As the last sentence of the caption of Fig. 2 of Fukamachi et al. (2014), the following sentence should be added: is the distance between a2 and a4. Fig. 2 of Fukamachi et al. (2014) is updated as Fig. 1 in the current article to reflect the correction.
Fukamachi, T., Jongsukswat, S., Ju, D., Negishi, R., Hirano, K. & Kawamura, T. (2014). J. Appl. Cryst. 47, 1267–1272. Web of Science CrossRef CAS IUCr Journals Google Scholar
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