view article
Figure 3
Sectional view (top) of the tungsten chamber, illustrating the principle of indirect flux monitoring. The primary beam (red) hits the back wall of the chamber where most of the photons are absorbed, but part of them are scattered towards the photosensitive area of the diode (not represented here). Front view (bottom) of the beamstop with its physical diameter and the diameter of the active area indicated.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48| Part 2| March 2015| Pages 431-443
doi:10.1107/S160057671500254X
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS