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Figure 1
Crystallization of SrTiO3 thin films monitored by GI-XRD through a temperature ramp of (a) 2 K min−1, (b) 4 K min−1 and (c) 8 K min−1 for Sr-rich (EBE) and (d) 4 K min−1 for Sr-deficient (RF SP) layers. The diffraction angle is shown for 12 480 eV photon energy. The appearance and disappearance of additional reflections are highlighted by white dashed and dash–dot lines, respectively. The black dashed line indicates the vanishing amorphous halo. Reflections of SrTiO3 are labeled.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48| Part 2| March 2015| Pages 393-400
doi:10.1107/S160057671500240X
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