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Figure 2
The evolution of the 002 reflection intensity with increasing temperature as extracted from the Bruker TOPAS SrTiO3 hkl output files. Intensities are scaled with respect to layer thicknesses and the global count maximum.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48| Part 2| March 2015| Pages 393-400
doi:10.1107/S160057671500240X
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