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Figure 4
(a) TEM cross section of the EBE sample at 40k magnification, showing a segregation into two different layers. (b) HRTEM image (400k magnification) of the top layer with a circle highlighting the crystalline size determined from the X-ray diffraction method. (c) Respective fast Fourier transform showing reflections, with squares indicating the [234] and circles displaying the [113] orientation of the cubic SrTiO3 phase. (d) TEM cross section of the RF SP sample with 100k magnification, displaying one layer. (e) HRTEM image at 400k magnification, highlighting the crystalline areas. (f) Fast Fourier transform showing cubic SrTiO3 in the [133] and [011] orientations, marked with squares and circles, respectively.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48| Part 2| March 2015| Pages 393-400
doi:10.1107/S160057671500240X
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