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![[Figure 5]](kc5002fig5mag.jpg)
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Figure 5
Depth-resolved XPS measurement of an Sr-rich SrTiO3 (EBE) thin film crystallized using a heating rate of 2 K min−1 up to 1223 K. The depth axis is calibrated according to Fig. 4 ![[link]](../../../../../../logos/arrows/j_arr.gif) (a). |
![[Figure 5]](kc5002fig5.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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Figure 5
Depth-resolved XPS measurement of an Sr-rich SrTiO3 (EBE) thin film crystallized using a heating rate of 2 K min−1 up to 1223 K. The depth axis is calibrated according to Fig. 4 (a). |
| JOURNAL OF APPLIED CRYSTALLOGRAPHY |
