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Figure 1
A SEM image of the SOFC + Ge sample prepared through FIB and (b) an image of a slice of the sample obtained by X-ray nanotomography absorption contrast, where the two slices measured through Laue tomography are indicated with dashed red lines. (c) Laue tomography experimental setup, with the two-dimensional detector positioned at an angle of 90° with respect to the incident beam direction (y direction). The direction of the tomographic rotation axis (x direction) is perpendicular with respect to the µ-beam.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48| Part 2| February 2015| Pages 357-364
doi:10.1107/S1600576715002447
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