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![[Figure 3]](zr5001fig3mag.jpg)
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Figure 3
High-resolution Φ scan close to the [011] in-plane direction with indication of the associated first and second reflecting planes of Si 200 multiple diffraction (Umweganregung). |
![[Figure 3]](zr5001fig3.jpg)
 | JOURNAL OF APPLIED CRYSTALLOGRAPHY |
ISSN: 1600-5767
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Figure 3
High-resolution Φ scan close to the [011] in-plane direction with indication of the associated first and second reflecting planes of Si 200 multiple diffraction (Umweganregung). |
| JOURNAL OF APPLIED CRYSTALLOGRAPHY |
