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Figure 5
2Θ–Φ mapping of the Si 200 reflection near the [011] in-plane direction measured in high-resolution mode and (a) parallel beam configuration and (b) with an additional Ge(400) × 2 collimator crystal and step widths of 0.02 and 0.02° for 2Θ and Φ, respectively.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48| Part 2| March 2015| Pages 528-532
doi:10.1107/S1600576715004732
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