view article
Figure 2
(a) Data collection view for a visit, showing data collection parameters, diffraction and sample thumbnails, and a DISTL plot. (b) Diffraction image viewer. (c) Beamline monitoring, showing webcams as well as ring and beamline status.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48| Part 3| June 2015| Pages 927-932
https://doi.org/10.1107/S1600576715004847
Follow J. Appl. Cryst.
Sign up for e-alerts
E-alerts
Follow J. Appl. Cryst. on Twitter
Twitter
Follow us on facebook
Facebook
Sign up for RSS feeds
RSS