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Figure 1
(a) Parametrization of radiation: for each cross section of the beam (planes 1 and 2 shown as examples), the axis x is parallel to the beam propagation direction; the axes y and z are perpendicular to the axis x and belong to the considered cross section. Each ray is characterized by its direction e and the coordinates y, z of the point where the ray hits the cross section. S is the X-ray source, D is the detector. (b) Idealized sample model: fixed scattering vector q provides complete determination of incident ray direction [{\bf e}_{\rm in}] by the diffracted ray direction [{\bf e}_{\rm out}]. (c) Detected signal. SD is the irradiated region of detector D; [\Omega_{\rm D}] is the solid angle from which radiation reaches the detector.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48| Part 3| June 2015| Pages 679-689
https://doi.org/10.1107/S1600576715006986
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