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Figure 2
Scheme of the diffractometer configuration: S is the X-ray source [including parabolic multilayer mirror (1) and a cross-beam optics unit with selection slit (2)], M is the incident-beam crystal optics [a two-bounce monochromator in (+-) arrangement is shown], IS is the incident slit, RS1 and RS2 are the receiving slits, A is the diffracted-beam crystal optics [a two-bounce analyzer in (-+) arrangement is shown], and D is the detector.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48| Part 3| June 2015| Pages 679-689
https://doi.org/10.1107/S1600576715006986
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