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Figure 5
Simulated RSM with comparable effects of beam divergence, finite angular resolution of detector and beam nonmonochromaticity. The 224 reflection of ideal (001)-oriented silicon is considered. CTR is the crystal truncation rod, M is the monochromator streak, A is the analyzer streak and W is the wavelength streak.

Journal logoJOURNAL OF
APPLIED
CRYSTALLOGRAPHY
ISSN: 1600-5767
Volume 48| Part 3| June 2015| Pages 679-689
https://doi.org/10.1107/S1600576715006986
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